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Surface Analysis


The Surface Analysis facility aims to support researchers at Queen’s in the field of materials and polymer sciences in sample analysis, particularly those researchers focussing on surface and interfacial aspects of materials chemistry.  We also welcome external users.



The following techniques are supported by our Thermo Instruments 310-F Microlab:

Scanning Auger Microscope (SAM):  elemental mapping
of samples with 20 nm resolution (conducting solids only)

X-Ray Photoelectron Spectroscopy (XPS)
:  elemental
and chemical speciation of surfaces, particularly thin films

Scanning Electron Micropscope (SEM)
:  15 nm
resolution imaging of samples

Depth Profile Analysis
:  Ar ion etching for depth profiling analysis of elemental composition by XPS or Auger



Room 105
Department of Chemistry
Queen’s University
90 Bader Lane
Kingston, ON K7L 3N6
Tel:       613-533-2379 (manager office)
            613-533-6000 x. 74653 (lab)

 Support Team:

Dr. Hugh Horton Facility Manager.

Mr. Robin Roberts, Technician

Dr. Ruiyao Wang, Training and Operations