The Surface Analysis facility aims to support researchers at
Queen’s in the field of materials and polymer sciences in sample
analysis, particularly those researchers focussing on surface
and interfacial aspects of materials chemistry. We also welcome
external users.
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The
following techniques are supported by our Thermo Instruments 310-F Microlab:
Scanning
Auger Microscope (SAM):
elemental mapping
of samples with 20 nm resolution (conducting solids only)
X-Ray Photoelectron Spectroscopy (XPS):
elemental
and chemical speciation of surfaces, particularly thin films
Scanning Electron Micropscope (SEM):
15 nm
resolution imaging of samples
Depth Profile Analysis:
Ar ion etching for depth profiling analysis of elemental composition by XPS
or Auger |
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Location:
Room 105
Department of
Chemistry
Queen’s
University
90 Bader Lane
Kingston, ON K7L
3N6
Tel:
613-533-2379 (manager office)
613-533-6000 x. 74653 (lab)
Support Team:
Dr. Hugh Horton
Facility Manager.
hortonj@chem.queensu.ca
Mr.
Robin Roberts,
Technician
robin.roberts@chem.queensu.ca
Dr. Ruiyao Wang, Training and
Operations
ruiyao.wang@chem.queensu.ca
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